Hioki 3535 Digital LCR HiTester
Hioki 3535 Digital LCR HiTester
Features:
High-speed LCR meter with up to 120MHz sampling
High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development
* Broad Frequency Measurement Range ( 100 kHz to 120 MHz )
* High speed LCR testing (6ms/sample)
* 14 Parameter Types ( |Z|, |Y|, Θ, Rp, Rs(ESR), G, X, B, Lp, Ls, Cp, Cs, D (tan δ) and Q )
* Detachable Head Amp
* Load Compensation Function
* BIN ( Classification ) Measurement
A Head Amp unit 9700-10 must be factory adjusted for dedicated use with the 3535 before delivery.
This product is not supplied with test fixtures. Please select and purchase the test fixture options appropriate for your application separately.
Specifications:
http://www.hioki.com/product/3535/index.html
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